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Field
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autonomy in material characterization techniques (e.g., SEM, EDS, XRD, XPS), Timely and high-quality contributions to project deliverables, reports, and milestones Team-oriented attitude, continuous learning
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microscopy, scanning electron microscopy (SEM), X-ray photoelectron spectroscopy (XPS), and X-ray diffraction (XRD). Main Responsibilities Study plasma propagation and discharge dynamics in non-thermal plasma
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(phosphate, oxides) synthesis by solid state reactions, hydrothermal process or electrodeposition. These solids will be characterized through i) diffraction of X-rays (XRD), ii) Scanning Electron Microscopy
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material characterization techniques (e.g., SEM, EDS, XRD, XPS), Timely and high-quality contributions to project deliverables, reports, and milestones Team-oriented attitude, continuous learning mindset
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fiber production methods) Strong background in structure-property relationships of polymer and composite materials. Knowledge of advanced materials characterization techniques (SEM, TEM, XRD, FTIR
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an emphasis on material science or characterization completed within the last five years Strong background in materials characterization techniques, such as microscopy, XRD, EBSD, and X-ray CT Interest in
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ceramic engineering including hands-on, practical laboratory experience with material synthesis and processing, and analytical methods. Hands-on experience: XRD & Refinement, SEM-EDX, TGA-MS, DSC, BET, coin
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properties. Surface characterization will be carried out using techniques such as optical microscopy, scanning electron microscopy (SEM), X-ray photoelectron spectroscopy (XPS), and X-ray diffraction (XRD
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SD-26086 POSTDOCTORAL RESEARCHER IN THE PHYSICAL VAPOR DEPOSITION OF ELECTROCATALYST FOR PHOTOANO...
, Raman, SIMS, FTIR, SEM, XRD, UV/Vis/NIR) and electrochemical analysis will be employed to evaluate the thin film properties. The researcher will work closely with members of the hosting group to build up
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SD-26083 – POSTDOCTORAL RESEARCHER IN THE CHEMICAL VAPOR DEPOSITION OF METAL ORGANIC FRAMEWORKS F...
, including surface analysis (XPS, Raman, SIMS, HRMS, BET, TEM, FTIR, SEM, XRD, UV/Vis/NIR) and electrochemical analysis will be employed to evaluate the thin film properties. The researcher will work closely