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criteria. The doctoral work will be primarily experimental: synthesis, thermomechanical processing, characterizations (XRD, SEM, EBSD, TEM, etc.), and mechanical testing. The recruited candidate will be
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diffraction (XRD), profilometry, and spectroscopic ellipsometry, complemented by optoelectronic characterization of the fabricated devices. Overall, the project supports IEMN research on light-emission
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in process engineering, design of experiments, numerical simulation, thin film characterizations by a combination of structural, chemical and physical methods (XRD, Raman, IRTF, SIMS, XPS, Ellipsometry
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