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Field
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microscopy, and conductive force microscopy); surface characterization (XPS), advanced computing concepts (neuromorhpic, stochastic, probabilistic); data security; energy-efficient information technologies
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entail electrode preparation, cell assembly, electrochemical testing, characterization of interfaces (largely SEM and XPS, but could also include FTIR, XRD), and experimental/analysis methodology
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materials using various surface analytical techniques (e.g., XPS, SEM, etc.). Evaluate the performance of the functionalized textiles and assess their suitability for the targeted applications. Collaborate
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for specific textile functionalities (antibiofilm, repellence, adhesion). Characterize the deposited materials using various surface analytical techniques (e.g., XPS, SEM, etc.). Evaluate the performance
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material characterization techniques (e.g., SEM, EDS, XRD, XPS), Timely and high-quality contributions to project deliverables, reports, and milestones Team-oriented attitude, continuous learning mindset
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porous materials. Proven expertise in the characterization of carbon materials (e.g., XPS, Raman spectroscopy, SEM) and adsorption methods. Experience with supercapacitors, electrochemical CO2 capture
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to examine the textural and structural properties of porous materials using a panoply of characterization techniques such as XRD, N2 adsorption, SEM, TEM, XAS, XPS, dissolution-NMR, IR spectroscopy and TGA
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characterization techniques such as XRD, N2 adsorption, FESEM, TEM, XAS, XPS, dissolution-NMR, IR spectroscopy and TGA and other related spectroscopy techniques such as UV and fluorometer Able to monitor
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High-pressure XPS measurements may also be envisioned for most promising catalysts. Similarly, are we collaborating with CatTheory on predicting reaction pathways and microkinetic modelling screening
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SD-26086 POSTDOCTORAL RESEARCHER IN THE PHYSICAL VAPOR DEPOSITION OF ELECTROCATALYST FOR PHOTOANO...
physical vapor deposition of transparent oxide thin films and metal alloy thin films for advanced electrocatalytic applications (WP1). Comprehensive characterization methods, including surface analysis (XPS