Sort by
Refine Your Search
-
Listed
-
Country
-
Employer
-
Field
-
materials Able to examine the textural and structural changes of porous materials by using a panoply of characterization techniques such as XRD, N2 adsorption, FESEM, TEM, XAS, XPS, dissolution-NMR, IR
-
undergo comprehensive material characterization to assess layer quality through techniques such as high-resolution X-ray diffraction (HRXRD), X-ray photoelectron spectroscopy (XPS), ellipsometry, atomic
-
spectroscopy (EIS). Experience with advanced structural and surface sensitive spectroscopic characterization such as Secondary Ion Mass Spectrometry, XPS, high resolution electron microscopy approaches and/or
Searches related to xps
Enter an email to receive alerts for xps positions