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Field
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of radiofrequency (MHz–GHz) nanoscale phenomena in systems relevant to microelectronics and quantum information science. Opportunities also exist for cross-platform studies integrating ultrafast TEM with ultrafast x
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-resolution imaging and spectroscopy of nanoparticles using advanced broad- and focused-beam transmission electron microscopy (TEM) techniques. 2. Structure–Catalysis Relationships at the Atomic Scale You will
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characterization techniques (e.g., HPLC, GC-MS, SEM, TEM, BET …). Write scientific reports, and research articles, and participate in conferences. Candidate Profile PhD degree in Materials Science, Chemical
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-resolution imaging and spectroscopy of nanoparticles using advanced broad- and focused-beam transmission electron microscopy (TEM) techniques. (2) Structure–Catalysis Relationships at the Atomic Scale You will
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fiber production methods) Strong background in structure-property relationships of polymer and composite materials. Knowledge of advanced materials characterization techniques (SEM, TEM, XRD, FTIR
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: Characterization of sorbent/porous materials characterization e.g. nitrogen sorption (BET, BJH, NLDFT), breakthrough measurements, SEM, TEM, TGA, FTIR, NMR, thermal conductivity measurements Synthesis and/or shaping
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SD-26083 – POSTDOCTORAL RESEARCHER IN THE CHEMICAL VAPOR DEPOSITION OF METAL ORGANIC FRAMEWORKS F...
, including surface analysis (XPS, Raman, SIMS, HRMS, BET, TEM, FTIR, SEM, XRD, UV/Vis/NIR) and electrochemical analysis will be employed to evaluate the thin film properties. The researcher will work closely
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SD-26084 – POSTDOCTORAL RESEARCHER IN THE CHEMICAL VAPOR DEPOSITION OF COVALENT ORGANIC FRAMEWORK...
, including surface analysis (XPS, Raman, SIMS, HRMS, BET, TEM, FTIR, SEM, XRD, UV/Vis/NIR) and electrochemical analysis will be employed to evaluate the thin film properties. The researcher will work closely
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SD-26085 POSTDOCTORAL RESEARCHER IN THE OXIDATIVE CHEMICAL VAPOR DEPOSITION OF FUNCTIONAL BUILDIN...
chemical vapor deposition of unexplored building blocks for the synthesis of functional thin films (WP2). Comprehensive characterization methods, including surface analysis (XPS, Raman, SIMS, HRMS, TEM, FTIR
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to examine the textural and structural properties of porous materials using a panoply of characterization techniques such as XRD, N2 adsorption, SEM, TEM, XAS, XPS, dissolution-NMR, IR spectroscopy and TGA