Sort by
Refine Your Search
-
Country
-
Field
-
autonomy in material characterization techniques (e.g., SEM, EDS, XRD, XPS), Timely and high-quality contributions to project deliverables, reports, and milestones Team-oriented attitude, continuous learning
-
for specific textile functionalities (antibiofilm, repellence, adhesion). Characterize the deposited materials using various surface analytical techniques (e.g., XPS, SEM, etc.). Evaluate the performance
-
SD-26086 POSTDOCTORAL RESEARCHER IN THE PHYSICAL VAPOR DEPOSITION OF ELECTROCATALYST FOR PHOTOANO...
, Raman, SIMS, FTIR, SEM, XRD, UV/Vis/NIR) and electrochemical analysis will be employed to evaluate the thin film properties. The researcher will work closely with members of the hosting group to build up
-
SD-26083 – POSTDOCTORAL RESEARCHER IN THE CHEMICAL VAPOR DEPOSITION OF METAL ORGANIC FRAMEWORKS F...
, including surface analysis (XPS, Raman, SIMS, HRMS, BET, TEM, FTIR, SEM, XRD, UV/Vis/NIR) and electrochemical analysis will be employed to evaluate the thin film properties. The researcher will work closely
-
SD-26084 – POSTDOCTORAL RESEARCHER IN THE CHEMICAL VAPOR DEPOSITION OF COVALENT ORGANIC FRAMEWORK...
, including surface analysis (XPS, Raman, SIMS, HRMS, BET, TEM, FTIR, SEM, XRD, UV/Vis/NIR) and electrochemical analysis will be employed to evaluate the thin film properties. The researcher will work closely
-
SD-26085 POSTDOCTORAL RESEARCHER IN THE OXIDATIVE CHEMICAL VAPOR DEPOSITION OF FUNCTIONAL BUILDIN...
, SEM, XRD, UV/Vis/NIR) and electrochemical analysis will be employed to evaluate the thin film properties for energy applications. The researcher will work closely with members of the hosting group
-
(SEM, DRX, XPS, etc.) · Experience in PVD and/or ALD is a plus. · High-level scientific and technological track record related to material chemistry and/or Li-ion battery is a plus
-
uniaxial creep tests (tension, compression) and comparing the results Characterization of the microstructure–property relationship using optical microscopy, SEM and EBSD Correlation of microstructure and