Sort by
Refine Your Search
-
RAP opportunity at National Institute of Standards and Technology NIST Designing Liquid Scintillators for Optimal Light Yield, Pulse Shape Discrimination, and Neutron Sensitivity
-
RAP opportunity at National Institute of Standards and Technology NIST Materials for Quantum Information Applications Location Physical Measurement Laboratory, Applied Physics Division
-
@nist.gov 301.975.3958 Description Scanning electron microscopy (SEM) is used for metrology of nanometer-scale features in semi-conductor electronics applications and for emerging nanotechnologies. SEM
-
of novel optical methods for nanoscale dimensional measurements using the NIST 193 nm Microscope: a newly upgraded, custom-built, world-class high-magnification optical imaging platform optimized
-
. We are seeking applicants interested in one or more of the following: developing instrumentation and sample preparation platforms, methods and applications development, utilizing multivariate data
-
RAP opportunity at National Institute of Standards and Technology NIST Applications of Organic Analytical Chemistry in Forensic Science Location Material Measurement Laboratory, Chemical
-
RAP opportunity at National Institute of Standards and Technology NIST High-Accuracy Measurements on Complex Mixtures with NMR Spectroscopy: Applications to Refrigeration, Forensic Science
-
importance in chemical analysis, mass spectrometry still lacks theories that can provide computational predictions useful to the analyst. Mass spectrometry encompasses a variety of experimental techniques
-
NIST only participates in the February and August reviews. This research opportunity centers on advancing experimental measurement methods to quantify complexes formed between charge-altering
-
its microscopic geometry, incorporating a wide variety of physical phenomena and using a modular structure that allows new physics to be added easily. More information is available at http