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material characterisation, including: AFM (including PFM or other nanoscale electromechanical modes) SEM/TEM Confocal microscopy Rheology FTIR, XRD, XPS Evaluate degradation profiles, electroactive behaviour
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techniques such as scanning electron microscopy (SEM), Transmission electron microscopy (TEM) and X-ray diffraction (XRD) to study the materials at the microscale and nanoscale) as well as access to National
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-ray diffraction (XRD) to study the materials at the micro and as well as access to national and international facilities for example synchrotron based experiments. Applicants should have, or expect
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CRM mobilization under undisturbed conditions. The work include multi-elementand isotope analysis and data interpretation. Mineralogical characterization (µXRF, XRD, SEM-EDS, electron microprobe, LA
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recrystallisation experiments using advanced analytical methods such as Raman spectroscopy, X-ray diffraction (XRD), scanning electron microscopy (SEM), transmission electron microscopy (TEM) and synchrotron-based
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the following areas is a clear advantage: materials science, piezoelectric/ferroelectric materials, semiconductors, sputter deposition, materials' charac-terization (especially XRD, XPS and/or SEM/TEM), lab
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-IR, XPS, XRD, SEM and more than 1200 battery cycling channels. Start date is July 1st, 2026 or upon agreement. Empa is committed to diversity, equity, and inclusion. We strongly encourage applications
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images, XCT scans, time-series from sensors during AM and/or vector/scalar datasets like XRD), with an initial focus on identification and deployment of techniques for proper data fusion/transformation
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criteria. The doctoral work will be primarily experimental: synthesis, thermomechanical processing, characterizations (XRD, SEM, EBSD, TEM, etc.), and mechanical testing. The recruited candidate will be
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diffraction (XRD), profilometry, and spectroscopic ellipsometry, complemented by optoelectronic characterization of the fabricated devices. Overall, the project supports IEMN research on light-emission