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material characterisation, including: AFM (including PFM or other nanoscale electromechanical modes) SEM/TEM Confocal microscopy Rheology FTIR, XRD, XPS Evaluate degradation profiles, electroactive behaviour
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synthesis and characterization techniques is an asset (e.g., XRD, SEM/TEM, XPS, UV–vis). Before applying, please note that to work at McGill University, you must be both authorized to work in Canada and
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SD-26045-RESEARCHER IN ADVANCED PLASMA-ASSISTED DEPOSITION PROCESS DEVELOPMENT FOR CATALYTIC THIN...
competencies: proven autonomy in material characterization techniques (e.g., SEM, EDS, XRD, XPS), knowledge and/or experience in prototyping development, experience in catalysis and catalytic materials
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materials characterization (e.g., UV-Vis-NIR, FTIR, XRD, SEM, AFM, Profilometer); Ability to work in a multidisciplinary team in an international environment and to work autonomously; Experience in providing
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techniques: X-ray powder diffraction (XRD), X-ray photoelectron spectroscopy (XPS), N₂ adsorption/desorption, scanning and transmission electron microscopy (SEM/TEM), confocal microscopy, small-angle X-ray