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material characterisation, including: AFM (including PFM or other nanoscale electromechanical modes) SEM/TEM Confocal microscopy Rheology FTIR, XRD, XPS Evaluate degradation profiles, electroactive behaviour
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: Archeometallurgical analyses SEM-EDS microscopy and chemical composition analysis of iron artifacts, slags, and ores GIS spatial analysis, statistical analysis, and network analysis of iron production Other
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characterisation techniques including SEM, EDX, XRD, XPS, Raman spectroscopy, nanoindentation, cyclic voltammetry, and EIS, complemented by access to European partner facilities (e.g. TEM, tribology
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Communities in early medieval Europe) Involvement in publication activities, possibly also presentation of research results. The content of the research activity: Archeometallurgical analyses SEM-EDS microscopy
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conjunction with imaging techniques (TEM, SEM, and AFM). This research project falls within CERMAV's key research areas and is being carried out within the “Self-assembly and Physicochemistry of Glycopolymers
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synthesis and characterization techniques is an asset (e.g., XRD, SEM/TEM, XPS, UV–vis). Before applying, please note that to work at McGill University, you must be both authorized to work in Canada and
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SD-26045-RESEARCHER IN ADVANCED PLASMA-ASSISTED DEPOSITION PROCESS DEVELOPMENT FOR CATALYTIC THIN...
competencies: proven autonomy in material characterization techniques (e.g., SEM, EDS, XRD, XPS), knowledge and/or experience in prototyping development, experience in catalysis and catalytic materials
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materials characterization (e.g., UV-Vis-NIR, FTIR, XRD, SEM, AFM, Profilometer); Ability to work in a multidisciplinary team in an international environment and to work autonomously; Experience in providing
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into functional systems. Technical Skills: Advanced analytical techniques (e.g., SEM, TEM, XPS, Raman spectroscopy). Hands-on experience with nanomaterial functionalization and coating processes. Soft Skills
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techniques: X-ray powder diffraction (XRD), X-ray photoelectron spectroscopy (XPS), N₂ adsorption/desorption, scanning and transmission electron microscopy (SEM/TEM), confocal microscopy, small-angle X-ray