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(including AFM, PFM); imaging of magnetic domains (MFM); analysis of bit states for probabilistic computing (Shannon entropy, bit error rate, unclonable functions, etc.); analysis of surfaces (XPS); experience
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of the printed layers using profilometry, SEM and AFM to ensure optical quality and adhesion. Leading the production of smart window modules. Where to apply Website https://seuelectronica.upc.edu/en/procedures
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