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and molecular function. The project will build on the MDSPACE image analysis software [2], and its application to characterising VCP/p97 dynamics [3], to analyse cryo‑electron microscopy (cryo-EM
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PhD position: Nanoengineering refractory compositionally complex alloys for extreme conditions (M/F)
will be performed using transmission electron microscopy (TEM) and time-of-flight secondary ion mass spectrometry (TOF-SIMS), providing access to atomic-scale structural and chemical information. Ion
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techniques to assess process outcomes, material quality, and device performance, including optical microscopy, photoluminescence, scanning electron microscopy (SEM), atomic force microscopy (AFM), x-ray
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Description This PhD project aims to develop advanced software solutions for cryo-electron microscopy (cryo-EM) data analysis, modeling conformational heterogeneity, and identifying optimal binding candidates
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for cryo-electron microscopy (cryo-EM) data analysis, modeling conformational heterogeneity, and identifying optimal binding candidates, by integrating image analysis and docking across multiple structural
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of these materials using a wide range of techniques (XRD, IR, NMR, UV-Vis, gas sorption, electron microscopy, etc.), as well as in the evaluation of their catalytic properties. The candidate must possess a solid
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) Positions PhD Positions Application Deadline 26 Apr 2026 - 23:59 (Europe/Paris) Country France Type of Contract Temporary Job Status Full-time Offer Starting Date 1 Oct 2026 Is the job funded through the EU
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6 Mar 2026 Job Information Organisation/Company European Synchrotron Radiation Facility Research Field Physics Researcher Profile Established Researcher (R3) Positions PhD Positions Application
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the team's optical and magnetotransport benches to study electronic properties. He will work under the supervision of Matthieu Jamet, head of the 2D spintronics team, as part of the PEPR SPIN TOAST and PEPR
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contact and thus minimize friction and damage to the surfaces for improved energy efficiency [5,6]. To characterize these different polymer brushes, atomic force microscopy (AFM) is used, which in its