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optoelectronic properties at multiple length scales using advanced local microscopy and characterization techniques (such as scanning probe–based approaches); Study of charge transport, recombination, and
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(knowledge of time-resolved spectroscopy will be an additional asset); • Expertise in the study of morphology and structure of thin organic layers (AFM and scanning probe microscopy, electron microscopy
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of the project is to map these states with Scanning Tunneling Microscopy/Spectroscopy (STM/STS) and where possible, angle-resolved photoemission spectroscopy (ARPES). Your work will focus on the spectroscopy, and
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of the project is to map these states with Scanning Tunneling Microscopy/Spectroscopy (STM/STS) and where possible, angle-resolved photoemission spectroscopy (ARPES). Your work will focus on the spectroscopy, and
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elucidate their magnetic structures and topological properties through various measurement techniques such as magnetometry, scanning probe microscopy, and neutron scattering. * details of the business RIKEN
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crosslinking of the illuminated area: the LEPO's expertise in scanning probe microscopy (AFM, STM) combined with light excitations will be used to monitor the evolution of the assemblies formed under
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solid background in surface science, previous exposure to scanning probe microscopy or UHV-based techniques, fluent English, proof of scientific publishing, legal ability to travel within the EU, and