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. - Characterization and analysis of meteorites using scanning electron microscopy and electron microprobe - Elemental and isotopic analyses using the ion microprobe and/or noble gas mass spectrometry - Data
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optoelectronic properties at multiple length scales using advanced local microscopy and characterization techniques (such as scanning probe–based approaches); Study of charge transport, recombination, and
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crosslinking of the illuminated area: the LEPO's expertise in scanning probe microscopy (AFM, STM) combined with light excitations will be used to monitor the evolution of the assemblies formed under
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