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traditional thin-film devices include exceptional structural quality, high surface-to-volume ratio, bottom-up device engineering with high-density on-chip integration, and utilization of quantum size effects
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RAP opportunity at National Institute of Standards and Technology NIST Coherent Spectroscopy of Quantum Dots Location Physical Measurement Laboratory, Applied Physics Division opportunity
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RAP opportunity at National Institute of Standards and Technology NIST (S)TEM Characterization of Superconducting Materials for Quantum Computing Location Physical Measurement Laboratory
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RAP opportunity at National Institute of Standards and Technology NIST Methods and Applications in Ab Initio Thermochemistry Location Material Measurement Laboratory, Chemical Sciences Division
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corrected for, the noise and drift can directly affect not only the initial calibration of qubits, but also the coherence times and, ultimately, fidelities of the quantum control and readout operations
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RAP opportunity at National Institute of Standards and Technology NIST Advanced Instrumentation for Fundamental Electrical Measurements Location Physical Measurement Laboratory, Quantum
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RAP opportunity at National Institute of Standards and Technology NIST High-Performance Cryogenics Location Physical Measurement Laboratory, Quantum Electromagnetics Division opportunity
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RAP opportunity at National Institute of Standards and Technology NIST Metrology and Prototyping of Wide-Bandgap Semiconductor Quantum Nanowire Structures and Devices Location Physical
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RAP opportunity at National Institute of Standards and Technology NIST Enabling Advanced Functionalities in Photonics using Low-Dimensional Semiconductors Location Material Measurement
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order to better integrate other photonic technologies. With modified gratings, we can better engineer cold atom traps for other applications such as inertial sensing. We can also compactify the setup