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time-resolved hard X-ray diffraction microscopy and spectroscopy on single-crystalline bulk and thin film quantum materials (e.g. ferroelectrics, multiferroics, strongly correlated electron systems
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, and electrochemical impedance spectroscopy. An understanding of bulk and thin film materials characterization techniques such as X-ray diffraction, X-ray photoelectron spectroscopy, spectroscopic
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techniques including terahertz, optical, and x-ray radiation. Candidates with a strong background in quantum materials, ultrafast lasers, and synchrotron or FEL-based x-ray diffraction techniques are highly
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Coherent Diffraction Imaging (BCDI), ptychography, and X-ray Photon Correlation Spectroscopy (XPCS). The goal is to move beyond simple correlations to discover the causal, governing rules of defect-property
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related field Demonstrated experience with scanning/transmission electron microscopy (S/TEM) and/or diffraction (Lorentz S/TEM experience is a plus) Strong foundation in electronics and devices, including
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perform advanced synchrotron experiments to probe structural, chemical, and dynamic evolution of defects in thin films and heterostructures. Utilize techniques such as Bragg coherent diffraction imaging
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measurement Experience in x-ray diffraction techniques Experience designing and building experimental control and data acquisition systems Ability to model Argonne’s core values of impact, safety, respect
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completed in a relevant field of study. Knowledge of x-ray/optical/electron physics, including diffraction, optics, detectors, scattering etc. Experience with deep learning (DL) libraries such as Tensorflow
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to interact with people at all levels both within and outside the laboratory. Preferred Knowledge, Skills, and Experience Experience with X-ray scattering/diffraction and quantitative data analysis and modeling