23 postdoc-in-coherent-x-ray-diffraction Postdoctoral positions at Oak Ridge National Laboratory
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research at the intersection of quantum information science and fundamental materials science focused on understanding the coherent dynamics of optically accessible spins in bulk and van der Waals materials
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and Eligibility Applications will be accepted from January 7, 2026, March 1, 2026, for one position starting as early as May 4, 2026. This position will support one postdoc for two years. You must first
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properties of the above materials. Collaborate with ORNL postdocs and staff who are involved in structural characterization. Participate in the development of new ideas and projects. Present and report
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understanding of ferroelectrics, especially in thin film form. Experience in Python and/or Matlab. Experience in materials characterization techniques such as Raman, X-ray diffraction, and scanning electron
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Requisition Id 15880 Overview: Oak Ridge National Laboratory is the largest US Department of Energy science and energy laboratory, conducting basic and applied research to deliver transformative solutions to compelling problems in energy and security. We are seeking an outstanding Postdoctoral...
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Requisition Id 16121 Overview: We are seeking a highly qualified candidate for a postdoctoral position in the Neutron and X-ray Scattering Group (NXSG). This position will support science programs
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physical characterization techniques (differential scanning calorimetry, dynamic light scattering, small angle neutron and/or x-ray scattering) to characterize the DIBs; and (3) Develop/implement image
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an emphasis on material science or characterization completed within the last five years Strong background in materials characterization techniques, such as microscopy, XRD, EBSD, and X-ray CT Interest in
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of irradiated materials using advanced techniques such as transmission and scanning electron microscopy, X-ray tomography, and related methods. Analyze experimental data to determine mechanisms of irradiation
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thermal analysis (DSC/TGA). Hands-on experience in materials characterization using tools such as particle size analysis, optical microscope, scanning electron microscopy, X-ray diffraction. Strong