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preparation, manipulation, and electrical probing in conjunction with electron microscopy (SEM). Such probes not only have proven research utility, but are also used in industrial development and process
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301.975.4579 Description As the demand for high resolution, high content imaging increases, the cost and challenges of acquiring, storing, processing, and analyzing today’s very large imaging data sets are even
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NIST only participates in the February and August reviews. In situ characterization of advanced ceramic sintering processes The past decade has seen the development of several novel methods
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of novel optical methods for nanoscale dimensional measurements using the NIST 193 nm Microscope: a newly upgraded, custom-built, world-class high-magnification optical imaging platform optimized
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NIST only participates in the February and August reviews. Project Description:NIST is developing a novel neutron interferometric phase imaging method using a grating-based, far-field interferometer
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function; (2) explore available algorithms for image post-processing to recover original information about the visual environment; (3) explore scientific applications of new imaging methods; and (4) develop
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mechanical parts and assemblies (SolidWorks experience is preferable), experience with developing VI’s in LabVIEW, and experience with data and image processing (MATLAB experience preferable). [1] Huang, W
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the measurement of infrared radiation for applications to remote sensing, fundamental metrology, process monitoring, homeland security, defense, and biomedical areas. Specific interests include (1) the development
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imaging and analysis methods, as well as collaborative efforts with other NIST laboratories for image processing and 3D visualization methods. key words Electron microscopy; Confocal microscopy
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such as microLEDs, photonic crystals, metamaterials, mechanical resonators and specialty scanning probes. These structures exhibit unique physical phenomena and pose new materials characterization