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(ILL). The current ML models are optimized mainly for (monochromatic) X-ray reflectometry. We aim to generalize this approach to a wide range of samples and time-of-flight NR, coupled with automatic data
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of Operating Microelectronic Devices by X-ray Diffraction Microscopy Beamline ID01, at the ESRF is a world leading instrument dedicated to micro- and nano-beam X-ray diffraction imaging experiments. It enables
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