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Broadband Electromagnetic Characterization of Thin-Film Electronic Materials and Devices NIST only participates in the February and August reviews. Electronic material are important for an extremely
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RAP opportunity at National Institute of Standards and Technology NIST Flexible Electronics Reliability Location Material Measurement Laboratory, Applied Chemicals and Materials Division
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RAP opportunity at National Institute of Standards and Technology NIST Autonomous experimentation and machine learning of material properties Location Material Measurement Laboratory, Materials
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RAP opportunity at National Institute of Standards and Technology NIST Dielectric and Rheological Characterization of Chiral Cellulose Nanocrystal Polymer Composites Location Material
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RAP opportunity at National Institute of Standards and Technology NIST Computational Studies of Functional Oxide Materials and Devices Location Material Measurement Laboratory, Materials
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RAP opportunity at National Institute of Standards and Technology NIST Conductivity and Resistivity of Materials Location Physical Measurement Laboratory, Quantum Measurement Division
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RAP opportunity at National Institute of Standards and Technology NIST Integrated Color Center Devices Location Physical Measurement Laboratory, Nanoscale Device Characterization Division
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RAP opportunity at National Institute of Standards and Technology NIST Materials characterization and performance of additively-manufactured alloys Location Material Measurement Laboratory
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RAP opportunity at National Institute of Standards and Technology NIST Femtosecond Time-resolved Optical Measurements in Condensed Matter Location Physical Measurement Laboratory, Nanoscale
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NIST only participates in the February and August reviews. First principles calculations, usually based on density functional theory (DFT), are a crucial aspect of modern materials physics research