44 manufacturing-technology Postdoctoral research jobs at Oak Ridge National Laboratory
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manufacturing competitiveness analysis relevant to advanced manufacturing technologies. The team builds and applies analysis tools and analytics to draw insights on the manufacturing sector’s impact on energy
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Analytics (MSA) Group in the Manufacturing Science Division (MSD), Energy Science and Technology Directorate (ESTD), at Oak Ridge National Laboratory (ORNL). Major Duties/Responsibilities: Develop algorithms
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Requisition Id 15885 Overview: We are seeking a Postdoctoral Research Associate – Simulation and Machine Learning for Composite Manufacturing who will focus on developing physics-based simulation
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qubit engineering to quantum algorithmic analysis to applications across the physical sciences (condensed-matter or high energy physics, data science). You will Interpret, report, and present research
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. This position resides in the Neutron & X-Ray Scattering, & Thermophysics group in the Materials Analysis and Interface Science Section, Materials Science and Technology Division, Physical Sciences Directorate
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environment. The successful candidate will develop and apply advanced machine learning techniques—including multimodal AI, computer vision, and large language models—to complex scientific and engineering
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Requisition Id 16217 Overview: The Multiscale Biomedical Systems Group within the Advanced Computing in Health (ACH) section of the Computational Sciences and Engineering Division (CSED) at Oak
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Requisition Id 16167 Overview: The Multiphysics Modeling and Flows (MMF) Group in the Computational Sciences and Engineering Division is seeking a Postdoctoral Research Associate with expertise in
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challenges facing the nation. The Computational Coupled Physics (CCP) Group within the Computational Sciences and Engineering Division (CSED), at Oak Ridge National Laboratory (ORNL) is seeking a Postdoctoral
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PhD in materials science and engineering, physics, chemistry, or electrical engineering or a related field. Preferred Qualifications: Experience in scanning transmission electron microscopy Background