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RAP opportunity at National Institute of Standards and Technology NIST Enabling Science from Big Microscopy Image Data Location Information Technology Laboratory, Software and Systems Division
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to reliable manufacturing of the next generation computing devices. Computational imaging methods such as coherent diffractive imaging, Fourier ptychography, structured illumination techniques, and other super
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; Computational microscopy; Dimensional metrology; Optical imaging;
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RAP opportunity at National Institute of Standards and Technology NIST Modeling Complex Microstructures Location Information Technology Laboratory, Applied and Computational Mathematics Division
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) and have a background in imaging, image analyses, machine learning, and software engineering. References: (1) A. J. Brooks et al, “Neutron interferometry detection of early crack formation caused by
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computational resources. key words Compressive sensing; Compressive sampling; Electron microscopy; Microanalysis; FIB; SEM; EDS; Imaging; Image analysis; Eligibility citizenship Open to U.S. citizens level Open
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RAP opportunity at National Institute of Standards and Technology NIST Identifying Material Behavior from Measurements and Simulations in Advanced Mechanical Testing Location Material
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Description The National Institute of Standards and Technology (NIST) is developing next-generation microfabricated magnetic devices and magnetic resonance imaging (MRI) contrast agents and sensors based
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RAP opportunity at National Institute of Standards and Technology NIST Four-Dimensional (4D) Scanning Transmission Electron Microscopy Location Material Measurement Laboratory, Materials
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RAP opportunity at National Institute of Standards and Technology NIST Fatigue and Fracture of Metallic Materials Processed via Additive Manufacturing Location Material Measurement Laboratory