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: each for twenty-four months] Duties The appointees will assist the project leader in the research project - “Assessing firm-level reverse economic performance: A study based on the Corporate Reverse
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Department of Computing Research Assistant (Ref. 260114018) [Appointment period: six to twelve months] Duties The appointee will assist the project leader in the research project - “KCube learning
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) perform any other duties as assigned by the VP(KT) or his delegates. Qualifications Applicants should: (a) have a recognised degree with at least five years of relevant working experience; (b) have a
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compliance with established guidelines and policies; and (i) perform any other duties as assigned by the Director of the Office or his delegates. Qualifications Applicants should have: (a) a recognised
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junior technical staff in UMF; (c) assist in the administrative management of UMF; (d) assist in the operation of the state-of-the-art dual aberration-corrected Scanning Transmission Electron
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drawings for various security systems and facilities, and evaluate the received tenders if necessary; (e) monitor the progress/quality of works performed by both contractors and in-house staff; (f
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projects on-time with minimum supervision. Preference will be given to those with research experience in machines design and development of computer programmes for numerical computation of electromagnetic
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analytics to facilitate decision making; and (e) perform any other duties as assigned by the Director of Human Resources or her delegates. Qualifications Applicants should: (a) have a diploma, associate
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-related instruments and facilities; (h) provide technical support for all fire-related consultancy works; and (i) perform any other duties as assigned by the Head of Unit or his delegates
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Department of Industrial and Systems Engineering Postdoctoral Fellow (Full-time/Part-time) (Ref. 260401006) [Appointment period: eight months] Duties The appointee will assist the project leader in the research project - “Next generation of in-situ precision three-dimensional surface metrology:...