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sequences against a reference, followed by a statistical analysis of the alignment results. However, even though the data are of the same type and the analysis techniques are similar, the processing steps may
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(e.g. ZTmax of massive Si 0.003 and ZTmax of massive Ge 0.026). Nanostructuration and surface treatment effects have already made it possible to improve the ZT factor on mesoporous silicon by inserting a
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knowledge of the structure and microstructure of crystalline and amorphous oxides, and experience in their development. Knowledge of microscopy, XRD, and thermal analysis techniques. Expected understanding
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