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(including AFM, PFM); imaging of magnetic domains (MFM); analysis of bit states for probabilistic computing (Shannon entropy, bit error rate, unclonable functions, etc.); analysis of surfaces (XPS); experience
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students and other researchers on in-situ (S)TEM. AVAILABLE INSTRUMENTS · Thermo Fisher Spectra 300 (60-300 keV), double corrected and monochromated, Gatan Continuum EELS with K3 direct electron detector
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