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techniques to assess process outcomes, material quality, and device performance, including optical microscopy, photoluminescence, scanning electron microscopy (SEM), atomic force microscopy (AFM), x-ray
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biology, microscopy and image analysis, and bioinformatics will be highly considered. Required languages: French and/or English. LanguagesENGLISH LanguagesFRENCH Additional Information Selection process To
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the team's optical and magnetotransport benches to study electronic properties. He will work under the supervision of Matthieu Jamet, head of the 2D spintronics team, as part of the PEPR SPIN TOAST and PEPR
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structural characterization of the corneocyte–lipid interface using state-of-the-art neutron diffraction and neutron reflectometry, combined with advanced optical microscopy approaches. The project is
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of Operating Microelectronic Devices by X-ray Diffraction Microscopy Beamline ID01, at the ESRF is a world leading instrument dedicated to micro- and nano-beam X-ray diffraction imaging experiments. It enables
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contact and thus minimize friction and damage to the surfaces for improved energy efficiency [5,6]. To characterize these different polymer brushes, atomic force microscopy (AFM) is used, which in its
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microscopy, nanosciences, biosensing, and nanobiotechnologies. Jerome Wenger’s group has acquired a wide expertise in the nanoscale control of light fields in plasmonic nanostructures and its application
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, The acquaintance with the spectroscopic methods (UV-VIS, IR, Raman), confocal microscopy, as well as with computer simulation skills is highly desirable. Additional Information Work Location(s) Number of offers
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by the electron beam deposition technique available in a modern facility established in Fresnel Institute (Espace Photonique). An optimal crystallization of the thin film layers is necessary in order
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will explore both purely plasmonic and hybrid metal–semiconductor architectures to tailor electronic and thermal properties. The project combines numerical modeling and experimental nanophotonics