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Field
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third of all produced electricity passes through power electronic devices at some stage before consumption with the predicted increase up to 80 % for the next decade. Therefore, even small efficiency
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magnetic pastes, and characterization techniques such as X-ray diffraction, Raman spectroscopy, and scanning electron microscopy, as well as in electrical and thermal properties (e.g., the Seebeck effect
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based) materials; b) the preparation and development of mixed-matrix membranes (MMMs) or similar membranes; c) characterization of materials using, for example, X-ray diffraction, vibrational spectroscopy
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the team's optical and magnetotransport benches to study electronic properties. He will work under the supervision of Matthieu Jamet, head of the 2D spintronics team, as part of the PEPR SPIN TOAST and PEPR
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include doped oxides or composites engineered to enhance ionic mobility while suppressing electronic conductivity. A key objective will be to understand the relationships between chemical composition
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of dislocation stress fields (in collaboration with CEA Saclay). - Program the diffraction procedures to generate images comparable to Electron Channeling Contrast Imaging (ECCI) obtained using a Scanning Electron
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line, glovebox) Proficiency in standard characterization techniques (NMR, IR, MS; GC, GC-MS X-ray diffraction) Familiarity with catalytic reactions; experience with high-pressure equipment (autoclaves
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Chemicals and Materials Division opportunity location 50.64.72.B7999 Boulder, CO NIST only participates in the February and August reviews. Advisers name email phone May L Martin may.martin@nist.gov (303) 497
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techniques to assess process outcomes, material quality, and device performance, including optical microscopy, photoluminescence, scanning electron microscopy (SEM), atomic force microscopy (AFM), x-ray
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diffraction analyses of pure substances, molten mixtures, or solidified mixtures after experiments. Dr. Blanka Kubíková. Keywords: molten fluorides, critical elements, physicochemical analysis, spectral and