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PhD student at ILL: studying In situ neutron diffraction for green steel and functional metal oxides
include oxides of chromium, iron, tungsten and the strongly correlated electron systems in SrFeO3−𝛿, LaNiO3 and SrRuO3. In situ neutron diffraction will allow to extract structural details including oxygen
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possess translational symmetry, the role of structure and symmetry in glasses is not established. This research programme involves the development of new x-ray and electron diffraction-based methods
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scanning electron microscope (SEM) ESRF Synchrotron: high-resolution diffraction Selection process Candidates will have to submit the following documents: Detailed and updated CV Cover letter Transcripts
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Peterson). This project combines both theory and experiment. "Geometric-flow across diffraction patterns in 4D scanning transmission electron microscopy” (with Dr Scott Findlay and Dr Timothy Peterson
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Dr Alireza Sadri) "Geometric-flow across diffraction patterns in 4D scanning transmission electron microscopy" (with Dr Timothy Petersen and Prof Michael Morgan) "Prospects for atomic-resolution
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an HHG source of ultrashort XUV pulses as the primary light source. The MAC user end-station is equipped with electron/ion spectrometers, detectors for coherent diffractive imaging and state-of-the-art
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third of all produced electricity passes through power electronic devices at some stage before consumption with the predicted increase up to 80 % for the next decade. Therefore, even small efficiency
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the team's optical and magnetotransport benches to study electronic properties. He will work under the supervision of Matthieu Jamet, head of the 2D spintronics team, as part of the PEPR SPIN TOAST and PEPR
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in magnetoelectric antiferromagnets. You will join the diffraction group at ILL, Grenoble, France. The diffraction group operates several powder and single-crystal diffractometer dedicated
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techniques to assess process outcomes, material quality, and device performance, including optical microscopy, photoluminescence, scanning electron microscopy (SEM), atomic force microscopy (AFM), x-ray