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Field
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with expertise in electron diffraction. Candidates should be capable of preparing samples, independently collecting data, and solving and refining crystal structures, including those
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Crystallographic investigation of novel materials using Neutron and X-ray diffraction and vibrational spectroscopy NIST only participates in the February and August reviews. Neutron and X-ray
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Sorbonne Université SIS (Sciences, Ingénierie, Santé) | Paris 15, le de France | France | about 2 months ago
étudiera la croissance et la structure de l'étain par microscopie à effet tunnel et diffraction des rayons X de surface sur synchrotron. Des résultats préliminaires ont déjà été obtenus sur les surfaces Ag
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ESPCI Ecole supérieure de physique et de chimie industrielles de la ville de Paris (PSL) | Paris 15, le de France | France | about 1 month ago
19 Mar 2026 Job Information Organisation/Company ESPCI Ecole supérieure de physique et de chimie industrielles de la ville de Paris (PSL) Research Field Engineering » Electronic engineering
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.B1995 Gaithersburg, MD NIST only participates in the February and August reviews. Advisers name email phone Hui Wu huiwu@nist.gov 301 975 2387 Description We develop and study new materials for carbon
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characterization techniques to determine processing-structure-property relations that occur during processing, including scanning and transmission electron microscopy, thermal analysis, and x-ray diffraction
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facilities also include more traditional metallurgical instruments including light optical microscopy, scanning electron microscopy with EBSD and ECCI capabilities, TEM, and x-ray diffraction, as
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electronics familiarity - Familiarity with X-ray diffraction - Familiarity with Fourier transform infrared spectroscopy (FTIR) - Knowledge of python scientific stack (NumPy, SciPy
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compounds. Intermetallic catalysts stand out for their exceptional stability and diverse atomic and electronic structures. This versatility allows them to perform efficiently under harsh conditions, offering
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: far-field microscopy (constrained by the diffraction limit) and near-field scanning optical microscopy (NSOM), which circumvents this limitation by detecting evanescent waves within a few nanometers of