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Field
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Chromatograph, Elemental Analyzer, Spectrophotometer, X-ray Diffraction Unit and any other shared teaching/research equipment. Train and oversee student use as needed. Repair and replace parts as needed. Maintain
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diffraction and compositional analysis -Experience in developing software and circuitry design that can be broadly applied to the automation of experimental apparatus -Maintenance of ultra-high vacuum equipment
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a range of characterization techniques, including X-ray diffraction, electron microscopy, X-ray photoelectron spectroscopy, as well as various electrochemical measurements, with opportunities
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harmful microorganisms. You will actively work with the characterization of various materials using environmental electron microscopy, X-ray diffraction, AFM, and various spectroscopic methods such as NMR
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, mass spectrometry, X-ray diffraction, X-ray photoelectron spectroscopy, vibrational spectroscopy, and electron microscopy. Documented experience in photophysical characterization, including UV–Vis
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etc) Advanced characterization of steels, for example transmission electron microscopy and electron backscatter diffraction (EBSD). Mechanical property testing Materials modelling, with experience
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diffraction (XRD), scanning electron microscopy (SEM), X-ray computed tomography (XRCT) Expertise in designing and performing high-temperature and high-pressure in-situ experiments is advantageous. Fluency in
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characterization of C and SiC fibers - Training on bench use (in particular heating techniques by Joule effect, laser diffraction, infrared imaging, pyrometry, preparation of micrometric samples, ...) - Technical
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Materials characterization using techniques including optical microscopy (OM), scanning electron microscopy (SEM), energy dispersive spectroscopy (EDS), X-ray diffraction (XRD), and optical profilometry
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related analysis Experience with neutron and/or X-ray diffraction Experience with other spectroscopic techniques (Raman, Mössbauer, etc.) Previous beamline support experience in a neutron or synchrotron X