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Field
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receive strong co-supervision on fundamentals and instrumental science at Harwell, from Prof Paul Donaldson (FLF) at CLF-Ultra in time-resolved spectroscopy3, Dr Ivan da Silva at ISIS-GEM in diffraction and
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diffraction, x-ray absorption spectroscopy for the quantification of chemical short range order, and automated microstructural image analysis. The simulation approaches of interest include machine learning
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scattering, neutron scattering, photoelectron spectroscopy, etc. * Experience with lab-standard sample characterization techniques and related equipment (transport measurements, single crystal diffraction
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microscopy, electron spectroscopy and diffraction underpinned by a strong fundamental theoretical platform. We are currently looking for a Research Associate to support Dr Kim's Technicolour Intracellular
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recrystallisation experiments using advanced analytical methods such as Raman spectroscopy, X-ray diffraction (XRD), scanning electron microscopy (SEM), transmission electron microscopy (TEM) and synchrotron-based
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science, life sciences, advanced materials and magnetism. The second branch has a stronger focus on exploring coherence, with diffraction imaging, holography and x-ray photon correlation spectroscopy (XPCS
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Chromatograph, Elemental Analyzer, Spectrophotometer, X-ray Diffraction Unit and any other shared teaching/research equipment. Train and oversee student use as needed. Repair and replace parts as needed. Maintain
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Institut de Recherche en Génie Civil et Mécanique (GeM) | Saint Nazaire, Pays de la Loire | France | about 1 month ago
combineront des essais de nanoindentation quasi-statique et dynamique en environnement physiologique contrôlé avec des analyses microstructurales corrélatives (MEB, EBSD, diffraction des rayons X, tomographie
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materials. Additionally, the candidate must have experience with spark plasma sintering, x-ray diffraction, SEM/EDS, solid-state synthesis, hot pressing, coin cell and pouch cell building. Candidate must be a
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measurements during the build process. Material characterization includes SEM and TEM methods, lab and synchrotron X-ray diffraction, DSC, dilatometry, synchrotron X-ray and neutron residual stress measurements