1 diffraction "CEA" PhD positions

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  • CNRS | Grenoble, Rhone Alpes | France | 9 days ago

    using atomic force microscopy (AFM), Raman spectroscopy, X-ray diffraction, X-ray photoemission spectroscopy (XPS) and Rutherford backscattering spectroscopy (RBS), • the transfer of 2D materials and van

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