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measurements at cryogenic temperatures Structural and microstructural characterization using diffraction and microscopy techniques Use of advanced research infrastructure, including synchrotron and neutron
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“Revealing Order in Organic Semiconductors with Cryo-Electron Microscopy.” The successful candidate will apply and develop advanced cryo-electron diffraction and imaging methods to uncover structure–property
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conducting synchrotron-based X-ray diffraction and spectroscopy experiments at national user facilities; analyzing experimental data, preparing scientific manuscripts, and presenting research findings
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