14 coherent-x-ray-diffraction Postdoctoral positions at Oak Ridge National Laboratory
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research at the intersection of quantum information science and fundamental materials science focused on understanding the coherent dynamics of optically accessible spins in bulk and van der Waals materials
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understanding of ferroelectrics, especially in thin film form. Experience in Python and/or Matlab. Experience in materials characterization techniques such as Raman, X-ray diffraction, and scanning electron
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physical characterization techniques (differential scanning calorimetry, dynamic light scattering, small angle neutron and/or x-ray scattering) to characterize the DIBs; and (3) Develop/implement image
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an emphasis on material science or characterization completed within the last five years Strong background in materials characterization techniques, such as microscopy, XRD, EBSD, and X-ray CT Interest in
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Requisition Id 16121 Overview: We are seeking a highly qualified candidate for a postdoctoral position in the Neutron and X-ray Scattering Group (NXSG). This position will support science programs
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thermal analysis (DSC/TGA). Hands-on experience in materials characterization using tools such as particle size analysis, optical microscope, scanning electron microscopy, X-ray diffraction. Strong
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photoemission spectroscopy (ARPES), neutron/x-ray scattering, and spectroscopy. Major Duties/Responsibilities: Transport and scattering characterizations of correlated and topological materials. Physical property
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Laboratory (ORNL). As part of our research team, you will closely collaborate with a team that includes condensed matter theorists, experts in neutron/X-ray scattering, and experts in thin film and single
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of irradiated materials using advanced techniques such as transmission and scanning electron microscopy, X-ray tomography, and related methods. Analyze experimental data to determine mechanisms of irradiation
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industrial imaging data. You will directly contribute to developing and deploying algorithms for multi-modal tomography (X-ray, neutron, and electron), advancing methods for non-destructive evaluation (NDE