Sort by
Refine Your Search
-
using atomic force microscopy (AFM), Raman spectroscopy, X-ray diffraction, X-ray photoemission spectroscopy (XPS) and Rutherford backscattering spectroscopy (RBS), • the transfer of 2D materials and van
-
conjunction with imaging techniques (TEM, SEM, and AFM). This research project falls within CERMAV's key research areas and is being carried out within the “Self-assembly and Physicochemistry of Glycopolymers
Searches related to coherent diffraction imaging
Enter an email to receive alerts for coherent-diffraction-imaging positions