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of the printed layers using profilometry, SEM and AFM to ensure optical quality and adhesion. Leading the production of smart window modules. Where to apply Website https://seuelectronica.upc.edu/en/procedures
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microscopy) and has straightforward access to nanomaterial characterizations (TEM, AFM, DLS, zetametry). It will bring the candidate to work in a very dynamic scientific atmosphere, embracing energy and
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, and AFM microscopy. Reporting results, preparing manuscripts for publication, and presenting findings at conferences and seminars. Short-term international research visits (approx. one month per year
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into photonic or electronic systems Hands-on experience with SEM, AFM, TEM, and other characterization tools Demonstrated ability to work independently and collaboratively in a multidisciplinary environment
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project of studying nanoplastic generation and release via nanoscale abrasive wear using advanced atomic force microscopy (AFM) tools. This work will be supported through the NSF CAREER award. The project
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budding by correlative dSTORM/AFM. Nanoscale 1(13):6036-6044. doi: 10.1039/c8nr07269h. - Jouannet et al (2015) TspanC8 tetraspanins differentially regulate the cleavage of ADAM10 substrates, Notch
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(knowledge of time-resolved spectroscopy will be an additional asset); • Expertise in the study of morphology and structure of thin organic layers (AFM and scanning probe microscopy, electron microscopy
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National Aeronautics and Space Administration (NASA) | Pasadena, California | United States | 2 months ago
: UV/e-beam lithography, UV imprint, Thermal/E-beam evaporation, Vapor Deposition, Reactive ion/ICP etching, dry/wet etching, Annealing, Poling, SEM, AFM, Nanophotonic design software, Comsol, Ansys
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science. Preferably you have a background in STM/STS, photoelectron spectroscopy (ARPES, XPS) or Atomic Force Microscopy (AFM). Preferably you have experience with Ultra High Vacuum sample preparation
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science. Preferably you have a background in STM/STS, photoelectron spectroscopy (ARPES, XPS) or Atomic Force Microscopy (AFM). Preferably you have experience with Ultra High Vacuum sample preparation