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using atomic force microscopy (AFM), Raman spectroscopy, X-ray diffraction, X-ray photoemission spectroscopy (XPS) and Rutherford backscattering spectroscopy (RBS), • the transfer of 2D materials and van
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techniques to assess process outcomes, material quality, and device performance, including optical microscopy, photoluminescence, scanning electron microscopy (SEM), atomic force microscopy (AFM), x-ray
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conjunction with imaging techniques (TEM, SEM, and AFM). This research project falls within CERMAV's key research areas and is being carried out within the “Self-assembly and Physicochemistry of Glycopolymers
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