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Field
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the characterization and analysis of porous materials An excellent background in X-ray diffraction, electron diffraction, electron microscopy and related analytical techniques Open to learn new analytical tools, like
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The recent upgrade of the Advanced Photon Source has introduced the world’s brightest synchrotron x-ray source. The X-ray Science Division (XSD) at Argonne National Laboratory invites applications
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Postdoctoral Research Associate - Energy materials synthesis and exploration with neutron scattering
: A PhD in material science, chemistry, or related field completed within the last 5 years. Preferred Qualifications: Basic understanding of synchyrotron x-ray or neutron diffraction/scattering is
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of Condensed Matter Physics, Faculty of Science, Masaryk University, using, in particular, the Pulsed Laser Deposition (PLD), Vibration Spectroscopy Measurement (VSM), X-ray Diffraction, and X-ray Photoelectron
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. Conduct electrochemical characterization, including cyclic voltammetry, galvanostatic charge/discharge, and electrochemical impedance spectroscopy. Perform material characterization (X-ray diffraction
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Qualifications: A PhD in condensed matter physics, material science, computational science, or a related field. Preferred Qualifications: Basic understanding of x-ray or neutron scattering is desirable but not
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techniques including terahertz, optical, and x-ray radiation. Candidates with a strong background in quantum materials, ultrafast lasers, and synchrotron or FEL-based x-ray diffraction techniques are highly
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synthesis procedures for the formation of porous materials and their organic linkers. Characterize structure and physical properties of materials and determine structure-property relationships with x-ray
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analysis with X-ray and entron diffraction. Property characterisation using a physical property measurement system (PPMS) and a SQUID magnetometer (MPMS). Ab-initio DFT calculations for property predication
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. Experience using analytical tools, such as particle size analyzer, X-Ray diffraction, electron microscopy (SEM and TEM), spectroscopy (FTIR and Raman), surface area analysis, and electrochemical (EIS and RDE