Sort by
Refine Your Search
-
Listed
-
Category
-
Country
-
Employer
- DAAD
- Forschungszentrum Jülich
- Nature Careers
- Technical University of Denmark
- ; University of Birmingham
- ICN2
- University of Antwerp
- University of Nottingham
- ; Swansea University
- ; The University of Edinburgh
- ; University of Nottingham
- ; University of Plymouth
- CNRS
- Cranfield University
- Curtin University
- Empa
- European Magnetism Association EMA
- Faculty of Sciences of the University of Porto
- Free University of Berlin
- Ghent University
- Human Technopole
- NTNU - Norwegian University of Science and Technology
- National Research Council Canada
- Paul Scherrer Institut Villigen
- Swinburne University of Technology
- Tallinn University of Technology
- Technical University Of Denmark
- Technische Universitaet Darmstadt
- The University of Alabama
- The University of Manchester
- Universidad de Alicante
- University of Central Florida
- 22 more »
- « less
-
Field
-
powder X-ray diffraction, SEM and electrochemical characterization techniques. General Requirements: very good university degree (M.Sc. or equivalent) in chemistry or materials sciences; specialization in
-
powder X-ray diffraction, SEM and electrochemical characterization techniques. General Requirements: very good university degree (M.Sc. or equivalent) in chemistry or materials sciences; specialization in
-
powder X-ray diffraction, SEM and electrochemical characterization techniques. General Requirements: very good university degree (M.Sc. or equivalent) in chemistry or materials sciences; specialization in
-
technologies, physicochemical characterization of nanomaterials, using techniques such as SEM, TEM, DLS, XPS. Solid experience with electroanalytical techniques for characterization of the electrochemical
-
. The resulting dataset will be analysed using Structural Equation Modelling (SEM) to quantify the relationships between these factors and uncover both direct and indirect pathways affecting behaviours
-
: electrode/device fabrication using inkjet printing including rheolgy characterization, physicochemical characterization of nanomaterial, using techniques such as SEM, TEM, DLS, XPS. Solid experience with
-
applied electron microscopy. EMAT has several state of the art electron microscopes including three aberration corrected, high end FEI-Titan instruments, a dual beam FIB, an environmental SEM,... EMAT is
-
of these materials.State-of-the-art characterization techniques such as DSC, DMA, DTMA, micro-Computed Tomography (micro-CT), optical microscopy and Scanning Electron Microscopy (SEM) are combined with advanced numerical
-
. EMAT has several state of the art electron microscopes including three aberration corrected, high end FEI-Titan instruments, a dual beam FIB, an environmental SEM,... EMAT is also a pioneer in in situ
-
relevant materials characterization techniques (i.e. XRD, SEM, FTIR, Raman or similar) Personal characteristics In the evaluation of qualifications of the candidates, emphasis will be placed on education