331 embedded-system-"https:"-"https:"-"https:"-"https:"-"UCL"-"UCL" positions at NIST
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@nist.gov 301.975.4127 Description This research is centered on the development and application of analytical methods to the characterization of nanomaterials. Opportunities exist to study the composition
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of measurements and simulations is increasingly used to improve the understanding of mechanical testing results and provides a means to advance the mechanical testing paradigm toward fewer, more complex tests that
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RAP opportunity at National Institute of Standards and Technology NIST Enabling Science from Big Microscopy Image Data Location Information Technology Laboratory, Software and Systems Division
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RAP opportunity at National Institute of Standards and Technology NIST Augmented Intelligence for Semiconductor Manufacturing Location Engineering Laboratory, Intelligent Systems Division
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a premier tool for probing atomic dynamics, yet extracting physical insights from experimental data remains a significant computational challenge. Traditional methods—Empirical Force Fields and
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303.497.6184 Description We are looking for an atom based high power laser intensity measurement system. This atom-based technique should be traceable to the international system of standards and have potential
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are particularly interested in developing and characterizing hybrid quantum systems (interfaces between dissimilar physical media), suitable for quantum information purposes, and exotic sources of faint light
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@nist.gov 301.975.5656 Description The Nanomaterials Research Group is interested in developing analytical methods to foster improved design of nanoparticle-based therapeutics. The design principles
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is exchanged between organisms (e.g., between virus and host cells or between bacteria) and on adapting single nanopores for novel biological and biotechnological applications. It was recently shown
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precision microelectromechanical systems (MEMS) to improve measurement accuracy and throughput in scanning probe microscopy (SPM), particularly for scanning tunneling microscopy (STM) and atomic force