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Division opportunity location 50.77.31.C0556 Gaithersburg, MD NIST only participates in the February and August reviews. Advisers name email phone Carl Alexander Miller carl.miller@nist.gov (301) 975 5306
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Bias-induced Strain Mapping of Electronic and Energy Materials in an Atomic Force Microscope NIST only participates in the February and August reviews. Strain is induced when an electric field is
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Structural Systems Division opportunity location 50.73.11.B7075 Gaithersburg, MD NIST only participates in the February and August reviews. Advisers name email phone Joseph A. Main joseph.main@nist.gov (202
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@nist.gov 301.975.4127 Description This research is centered on the development and application of analytical methods to the characterization of nanomaterials. Opportunities exist to study the composition
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a premier tool for probing atomic dynamics, yet extracting physical insights from experimental data remains a significant computational challenge. Traditional methods—Empirical Force Fields and
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303.497.6184 Description We are looking for an atom based high power laser intensity measurement system. This atom-based technique should be traceable to the international system of standards and have potential
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are particularly interested in developing and characterizing hybrid quantum systems (interfaces between dissimilar physical media), suitable for quantum information purposes, and exotic sources of faint light
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@nist.gov 301.975.5656 Description The Nanomaterials Research Group is interested in developing analytical methods to foster improved design of nanoparticle-based therapeutics. The design principles
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is exchanged between organisms (e.g., between virus and host cells or between bacteria) and on adapting single nanopores for novel biological and biotechnological applications. It was recently shown
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, and light-matter interactions. This research opportunity is focused on developing compact, integrated cavity optomechanical devices that push the state of the art in terms of sensitivity and accuracy