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RAP opportunity at National Institute of Standards and Technology NIST Drug Toxicity Measurements with Tissues-on-chips and Microphysiologic Systems Location Physical Measurement Laboratory
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NIST only participates in the February and August reviews. The chemical characterization of biomolecules and the measurement of their interactions at low copy numbers are critical for applications in biomanufacturing and personalized medicine. We are developing new electronics techniques that...
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catalytic turnover. Integrative modeling and machine learning have the promise of establishing new tools for combining computational and experimental data from HDX-MS and NMR to explain the dynamics and
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group is working on a dual-track project to expand this class of materials, and the successful candidate will contribute to either the computational discovery or the experimental validation (or both
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RAP opportunity at National Institute of Standards and Technology NIST Autonomous experimentation and machine learning of material properties Location Material Measurement Laboratory, Materials Measurement Science Division opportunity location 50.64.31.C1094 Gaithersburg, MD NIST only...
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Division, where we develop instrumentation beyond the state of the art. Our research program offers a supportive, highly-multidisciplinary environment coupled with outstanding experimental resources
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, process, or part qualification and providing benchmarking datasets for model validation to support industry adoption and standards development of metal BJAM. NIST has researched other AM technologies
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RAP opportunity at National Institute of Standards and Technology NIST Engineering Atoms for Fundamental Constants and Atomic Data Location Physical Measurement Laboratory, Quantum Measurement
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RAP opportunity at National Institute of Standards and Technology NIST Discrete Photon Detection Location Physical Measurement Laboratory, Quantum Measurement Division opportunity location
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of the contact resonance shape factor for quantification and amplification of bias-induced strain in atomic force microscopy. Applied Physics Letters, 114, 133108. MacDonald, G. A., DelRio, F. W., and Killgore, J