Sort by
Refine Your Search
-
of nanomaterials and chemical entities that may be bound to nanomaterials, to use analytical separation techniques and instrumental methods to characterize physical and chemical properties and compositional
-
RAP opportunity at National Institute of Standards and Technology NIST Metrology and Prototyping of Wide-Bandgap Semiconductor Quantum Nanowire Structures and Devices Location Physical
-
the development of analytical methodologies, from both instrumentation and informatics standpoints, for the multifaceted and convoluted data that are obtained from complex biological, chemical, and forensic samples
-
., biomarkers, metabolites) must be evaluated using digital twins of breath device prototypes. Our digital twins are based on simulations using computational fluid dynamics (CFD) and computational fluid and
-
regimes, and accurate geometry- and biochemistry-based trajectory analyses. However, detailed molecular dynamics simulations are often too time-consuming to become the basis of computational measurements
-
process control measurements, and utilizing appropriate statistical analyses to understand the assay results and their uncertainties. This process should lead to improvements in the comparability and
-
Description Research focuses on the chemical and physical mechanisms of and in situ diagnostic development for thermal chemical vapor deposition (CVD) and atomic layer deposition (ALD), with applications in
-
are essential for broad adoption of these methods, this postdoc would collaborate with a unique array of technology and informatics developers in the Genome in a Bottle Consortium to develop authoritative de novo
-
Poppendieck dustin.poppendieck@nist.gov 301.975.8423 Description This program is designed to provide the measurement science to support the development of industry-consensus standards and guides related
-
301.975.6050 Jan Obrzut jan.obrzut@nist.gov 301.975.6845 Description As part of a collaborative NIST-wide program involving structural characterization, modeling, and high-throughput microwave measurement, we