164 evolution-"https:"-"https:"-"https:"-"https:"-"IMEDEA-CSIC-UIB" positions at NIST
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identification of spectral features by computer vision and machine learning. Our computational methods development has three primary goals. The first goal is continued support of expert-driven biomolecular
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results. We are also pursuing advanced data analysis techniques and development of neutron instrumentation and sample environments in support of autonomous experimentation and high-throughput measurement
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to profile the microbial communities based on metagenomics and transcriptomics approaches. The comprehensive profiling methodologies will provide the foundation for the development of reference materials
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301.975.3716 Description In support of the development of future electronic systems, research focuses in areas that relate to measurements and physics on the nanometer scale based on scanning tunneling
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properties, facilitating the development of accurate standard tests and predictive methods, and their safe use at full-scale. key words Laminar burning velocity; Refrigerant flammability; Numerical flame
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data analysis techniques, instrument and sample environment development, and simulation methods to compare to experimental results. We are particularly interested in the development of two techniques
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characterization aims to address some of these fundamental photonic challenges and aid the development of novel nanophotonic technologies. These efforts are expected to enable realization of accessible hybrid
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Development of magnetism-based future electronics is fueled by demand for large memory capacity and high data processing rates. New technologies such as hard drives with bit-patterned media and magnetic memory
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are developing machine learning-driven autonomous metrology research systems, with the goal of accelerating the development of self-correcting photonic and quantum sensor networks. These systems combine machine
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NIST only participates in the February and August reviews. Research on photovoltaics focuses on the development of new and improved device characterization methods for various cell technologies and