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world-class, unique controls and measurement capabilities, and flexibility to incorporate new research instrumentation and ideas. Further, our measurement facilities include X-ray computed tomography
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; Electron microscopy; X-ray diffraction; X-ray computed tomography; Mechanical properties; Fatigue; Fracture; Modeling; Atom probe; Microstructure; Processing; Eligibility citizenship Open to U.S. citizens
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computational software. The combination of this effort, with both its experimental and theoretical sections, with the complementary CW Terahertz Spectroscopy effort described elsewhere, greatly increases our
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Qubits controlled through a combination of gate voltages and magnetic fields require continuous calibration to compensate for drift and changes in the physical environment [1]. If not detected and corrected for, the noise and drift can directly affect not only the initial calibration of qubits,...
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MultiPhysics Measurements and Modeling for Microelectronics at Microwave and mm-Wave Frequencies NIST only participates in the February and August reviews. Performance, security, and reliability of microelectronics systems are critical issues for the continued robust growth of the US economy....
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and calibration, radiation-hardness testing, personnel protection, radiation modification of materials, waste treatment, and high-energy computed tomography. These accelerator facilities afford
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We develop and utilize state-of-the-art experimental and computational techniques to acquire, evaluate, and correlate thermodynamic data of standard reference quality with a particular emphasis on
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center. Applicants are expected to be skilled in one of the programming language such as C++/C, Perl, Matlab, or R, and have majored in Chemistry, Statistics, or Computer Science. Reference Yang X, et al
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via laboratory testbeds, numerous machining centers, and a nanoscale science center. Furthermore, NIST provides computational resources and has an interest group for AI that regularly meets, giving
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access to. Qualified candidates will have a background in electron microscopy or a relevant branch of computer science. key words Scanning transmission electron microscopy; Nanocharacterization; Electron