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Structural Systems Division opportunity location 50.73.11.B7075 Gaithersburg, MD NIST only participates in the February and August reviews. Advisers name email phone Joseph A. Main joseph.main@nist.gov (202
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electron excited X-ray microanalysis has been the electron probe microanalyzer with wavelength dispersive spectrometer (EPMA/WDS). On the other hand, energy dispersive X-ray microanalysis is often viewed as
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loading behavior. The Kolsky Bar, also known as the Split Hopkinson Bar, is a common technique for studying the high strain rate behavior of materials. Novel improvements to this technique include the use
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Facility for Adsorbent Characterization and Testing (FACT Lab) is equipped with a range of instruments, including manometric measurements of adsorption, gravimetric measurements of adsorption, measurements
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@nist.gov 301.975.4127 Description This research is centered on the development and application of analytical methods to the characterization of nanomaterials. Opportunities exist to study the composition
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of measurements and simulations is increasingly used to improve the understanding of mechanical testing results and provides a means to advance the mechanical testing paradigm toward fewer, more complex tests that
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RAP opportunity at National Institute of Standards and Technology NIST Enabling Science from Big Microscopy Image Data Location Information Technology Laboratory, Software and Systems Division
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RAP opportunity at National Institute of Standards and Technology NIST Augmented Intelligence for Semiconductor Manufacturing Location Engineering Laboratory, Intelligent Systems Division
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a premier tool for probing atomic dynamics, yet extracting physical insights from experimental data remains a significant computational challenge. Traditional methods—Empirical Force Fields and
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303.497.6184 Description We are looking for an atom based high power laser intensity measurement system. This atom-based technique should be traceable to the international system of standards and have potential