Sort by
Refine Your Search
-
NIST only participates in the February and August reviews. The Communications Technology Laboratories (CTL) at NIST is looking for a postdoctoral fellow to work to develop high-throughput materials
-
integrated devices architectures, such as three-dimensional integrated circuits (3D-ICs), are poised to open up new avenues for more powerful functionally diverse electronics devices. Unfortunately, there is a
-
, internal dynamics, materials physics and chemistry is of primary importance in determining the processing, performance and viability of advanced ceramic components such as relevant to solid oxide or hydrogen
-
NIST only participates in the February and August reviews. As of today, there is a plethora of cyber-physical instruments consisting of physical sensing (e.g., microscopy imaging) and cyber (digital
-
typically employ near-UV (355 nm) lasers. This is problematic because specimens of interest are often nanostructures variously composed of semiconductors, metals, oxides, nitrides--and sometimes even
-
NIST only participates in the February and August reviews. While natural and anthropogenic contaminants threaten existing freshwater supplies, the use of alternative, “dirty” sources is increasing
-
of microelectronics systems are critical issues for the continued robust growth of the US economy. With new trends towards silicon disaggregation and heterogeneous integration it is becoming increasingly difficult
-
variability that is due to experimental conditions in metabolomics experiments. The aim of this project is to establish a standard protocol to evaluate the analytical variability associated with liquid
-
of emerging devices. The ultimate goal is to explore the landscape of emerging hardware-based artificial intelligence systems to better understand the role played by measurement and metrology in these complex
-
ionization sources that allow for single-drop analysis with minimal competitive ionization and maximal analyte intensity is of major interest. Additionally, creation of statistical treatment methods