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the project, namely light microscopy facilities and equipment for protein purification. Where to apply Website https://emploi.cnrs.fr/Offres/CDD/UMR5077-FABERD-010/Default.aspx Requirements Research
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organized between the two teams. References : Fourier Analysis of Interference Scanning Optical Probe Microscopy. E. Soubies and W. Bacsa. IEEE Transactions on Computational Imaging, vol. 11, 2025. Optics
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; https://cordis.europa.eu/project/id/101087562 ), the postdoctoral researcher will be responsible for characterizing metal-rich meteorites, particularly primitive achondrites, using scanning electron
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pioneering method for obtaining the full conformational landscapes of biomolecular complexes at atomic scale from cryo electron microscopy (cryo-EM) images. It has been shown that MDSPACE analyzes
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is located in Montpellier, a vibrant research hub on the Mediterranean coast, and hosts world-class expertise in advanced microscopy, including multiplexed imaging, single-molecule super-resolution
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endoscopic exploration. Recently, we developed a wide-field coherent Raman microscopy technique using speckle illuminations and Coherent Anti-Stokes Raman Scattering (CARS) contrast to produce chemical images
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. Wide-field coherent anti-Stokes Raman scattering microscopy using random illuminations. Nat. Photon. 17, 1097–1104 (2023). https://doi.org/10.1038/s41566-023-01294-x The project is part of an H2020/ERC
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. This project aims to obtain high-resolution structures of the T4SS pilus by cryo-electron microscopy (cryo-EM), with a clear objective of rapidly generating structural data suitable for publication
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PhD position: Nanoengineering refractory compositionally complex alloys for extreme conditions (M/F)
microscopy (SEM) experiments will be used to identify deformation mechanisms and establish structure–property relationships. At the University of Arizona (U of A), state-of-the-art nanoscale characterization
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techniques to assess process outcomes, material quality, and device performance, including optical microscopy, photoluminescence, scanning electron microscopy (SEM), atomic force microscopy (AFM), x-ray