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18, as amended; FCT, I.P. Research Grant Regulations, in force (https://www.fct.pt/apoios/bolsas/docs/RegulamentoBolsasFCT2019.pdf ); Regulation No. 522/2020, published in the Official Gazette, 2nd
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of the printed layers using profilometry, SEM and AFM to ensure optical quality and adhesion. Leading the production of smart window modules. Where to apply Website https://seuelectronica.upc.edu/en/procedures
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, data acquisition hardware. Data Acquisition: Execute complex experiments involving high-bandwidth electrical measurements and advanced microscopy imaging (i.e., AFM and SEM) Signal Processing: Develop
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involve working in Paris as well as Orléans. Where to apply Website https://emploi.cnrs.fr/Candidat/Offre/UMR7065-NADSCH-003/Candidater.aspx Requirements Research FieldHistoryEducation LevelPhD
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or burn-resistant testing demonstrated experience with conducting microstructural characterization techniques such as SEM, TEM, XRD, EDS, EBSD, FIB/SEM etc., as well as physico-mechanical characterization
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funding. Appointment Start Date: Fall 2025 Group or Departmental Website: https://hph.stanford.edu/careers (link is external) How to Submit Application Materials: Submit all application materials
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electrodes using various electron microscopy techniques (e.g. FIB-SEM); (ii) Reconstruction of the 3D structure through image analysis; (iii) Analysis of images from new and aged membrane-electrode assemblies
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-electron microscopy–based approaches. More information about the laboratory can be found at: https://www.cryo-em.psu.edu/ . The postdoctoral scholar will contribute to ongoing projects to define structural
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and membranes. Preparing samples from vdW single crystals (thin layers, membranes, and heterostructures). Characterizing samples using Brillouin and Raman light-scattering techniques as well as SEM, TEM
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their structural and optical characterization by using atomic force microscopy (AFM), scanning electron microscopy (SEM), x-ray diffraction (XRD), and photoluminescence spectroscopy (PL). The research will be