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during the trans-catheterization process. They will characterize the surface modifications of implants using microscopy techniques, including Scanning Electron Microscopy (SEM) and Atomic Force Microscopy
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using microscopy techniques, including Scanning Electron Microscopy (SEM) and Atomic Force Microscopy (AFM). The candidate will also map the nanomechanical properties of implant surfaces, assessing
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. This would require knowledge in the design and synthesis of porous frameworks, particularly in techniques such as Schlenk line, glove box, powder X-ray diffraction, electron diffraction, electron microscopy
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